Comments on: Active-Passive bonding on Solaris 10

By: implicate_order

implicate_order — Wed, 03 Jun 2009 17:16:26 +0000

perhaps a little bit of “googling” would give you your answers and saved you some time.

But here goes:

1) IPMP is not Bonding (in the strictest sense), since IPMP only does Active/Passive High Availability with your NICs
2) Link aggregation is what you would consider bonding.

The two are very different beasts.
IPMP is done to provide FT across disparate switches.
Aggregation (and infact any teaming/bonding/aggregation) cannot be done across disparate switches. All members of the aggregation have to be on the same switch.

The “bond” groups you set up in the /etc/hostname.xxx files were not really bonds but IPMP FT (Fault Tolerance) groups.

IPMP works in several ways. The simplest is link-detection mode where it works at the datalink layer.

When you do that, you will see the “no test address configured” message in /var/adm/messages

You could set up two aggregated nics and then IPMP the two to set up switch disparity. The process would be exactly as you did with your /etc/hostname.e1000gx files, except the filenames would be /etc/hostname.aggr1 etc.

By: Rahul

Rahul — Sun, 29 Mar 2009 02:55:56 +0000

Can any one tell me what entry i have to make in “/etc/hosts” file for “group bond0″ and “group bond1″ Please

Thanks

By: sorted78

sorted78 — Mon, 12 Jan 2009 12:35:58 +0000

bollocks article! aggregation and IPMP are two completely different things.

By: anthony bentley

anthony bentley — Thu, 11 Dec 2008 00:57:33 +0000

I configured 4 nic's into two different groups by following these instructions. However, after I rebooted the system I received these errors (below). Do I need to configure a test address with ifconfig -failover option?: Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge1; di Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge1; di sabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge1; di sabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge0; di Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g1; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface e1000g0; disabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge1; di sabling probe-based failure detection on it Dec 10 08:12:41 in.mpathd[162]: No test address configured on interface bge0; di sabling probe-based failure detection on it